Work

I/sub DDQ/-testability of tree circuits

Year: 1999

Type: conference-paper

Source: International Conference on VLSI Design

DOI: 10.1109/icvd.1999.745128

Author: R.D. Blanton

Institution: Carnegie Mellon University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1967614936

FWCI:

Cites: 12

Cited by:

Related to: 9