Year: 1995
Type: article
Abstract: A full set of high-energy spectroscopy measurements including x-ray photoelectron valence band spectra and soft x-ray emission valence band spectra of both components of FeSi (FeK beta 5 , FeL alpha , SiK( beta 1 ,3) and SiL 2,3 ) are performed and compared with the results of ab initio band structure calculations using the linearized muffin-tin orbital method and the linearized augmented plane wave method.
Authors: V R Galakhov, E Z Kurmaev, V M Cherkashenko, Yu M Yarmoshenko, S N Shamin, A V Postnikov, S Uhlenbrock, M Neumann, Z W Lu, B M Klein, Zhu-Pei Shi
Institution: M.N. Mikheev Institute of Metal Physics
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2163103702