Work

Trace Analysis of Nanoscale Materials by Analytical Electron Microscopy

Year: 1994

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-332-287

Authors: Dale E. Newbury, Richard D. Leapman

Institutions: National Institute of Standards and Technology, National Institutes of Health

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Institute of Standards and Technology

OpenAlex ID: W2163496027

FWCI: 0.672

Cites: 5

Cited by: 2

Related to: 10