Work

Switching Activity Based Method for Minimizing Testing Power in Digital Circuits

Year: 2006

Type: article

Authors: K. Paramasivam, K. Gunavathi, Non-members

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2165196931

FWCI:

Cites: 17

Cited by: 4

Related to: 10