Work

A case study on the implementation of the Illinois Scan Architecture

Year: 2002

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/test.2001.966672

Authors: F.F. Hsu, K.M. Butler, J.H. Patel

Institutions: Texas Instruments (United States), University of Illinois Urbana-Champaign

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2168755502

FWCI: 10.03

Cites: 16

Cited by: 127

Related to: 10