Work

Control of application specific interconnection on gate arrays using an active checkerboard test structure

Year: 2005

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.1996.585568

Authors: C. Hess, L.H. Weiland, G. Lau, P. Simoncit

Institution: Karlsruhe Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2168821131

FWCI: 0.238

Cites: 10

Cited by: 6

Related to: 10