Work

Bridging faults modeling and detection in CMOS combinational gates

Year: 2003

Type: conference-paper

Source: Proceedings

DOI: 10.1109/dftvs.1992.224371

Authors: G. Buonanno, D. Sciuto

Institutions: Politecnico di Milano, University of Brescia

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2170736754

FWCI:

Cites: 15

Cited by: 1

Related to: 10