Work

Modeling of test structures for efficient online defect monitoring using a digital tester

Year: 2002

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.1994.303493

Authors: C. Hess, L.H. Weiland

Institution: Karlsruhe Institute of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2171651561

FWCI: 1.992

Cites: 11

Cited by: 21

Related to: 10