Work

An Approach to Functional Level

Year: 1989

Type: article

Author: Testability Analysis

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2186884946

FWCI:

Cites: 4

Cited by: 1

Related to: 10