Work

New techniques for logic built-in self-test

Year: 2005

Type: article

Authors: J.H. Patel, Liyang Lai

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2271597098

FWCI:

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Related to: 10