Novel Structural Characterisations of Insulating and Electron Beam Sensitive Materials Employing Low Voltage High Resolution Scanning Electron Microscopy
Year: 2013
Type: article
Authors: Osamu Terasaki, Haesung Cho, Minhyung Cho, HuYoung Jeong, Shunsuke Asahina, Yusuke Sakuda, Mituo Suga, Masato Kudo, Takeshi Nokuo, Zheng Liu, Sam M. Stevens, Michael W. Anderson, DianaCarolina GaleanoNunez, Ferdi Schüth, Tomas Kjellman, Viveka Alfredsson, Lu Han, Shunai Che, Hexiang Deng, Omar M. Yaghi, Kanghee Cho, Ryong Ryoo
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2273971204