Work

High-Resolution X-ray Photoelectron Spectroscopic Studies of Alkylated Silicon(111) Surfaces

Year: 2005

Type: article

Source: The Journal of Physical Chemistry B

DOI: 10.1021/jp047199c

Authors: Lauren J. Webb, E. Joseph Nemanick, Julie S. Biteen, David W. Knapp, David J. Michalak, Matthew C. Traub, Ally S. Y. Chan, Bruce S. Brunschwig, Nathan S. Lewis

Institutions: Rutgers, The State University of New Jersey, California Institute of Technology

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2312591162

FWCI: 4.158

Cites: 45

Cited by: 90

Related to: 10