Work

Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis: Vorschriften, Methoden und Bemerkungen

Year: 1982

Type: article

Source: Fresenius Zeitschrift für Analytische Chemie

DOI: 10.1007/bf00482725

Authors: R. Delhez, Th. H. de Keijser, E. J. Mittemeijer

Institution: Delft University of Technology

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2317909330

FWCI: 5.677

Cites: 53

Cited by: 425

Related to: 10