Work

Approaches of error diagnosis and correction in combinational circuits

Year: 2003

Type: conference-paper

Source: IEEE International Conference on ASIC (ASICON)

DOI: 10.1109/icasic.2003.1277422

Authors: Li Xing, Yan Xiao-lang, Ge Hai-tong

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2318099750

FWCI:

Cites: 8

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Related to: 10