Work

Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing

Year: 2016

Type: article

Source: Journal of Electronic Testing

DOI: 10.1007/s10836-016-5582-4

Authors: Masahiro Ishida, Toru Nakura, Takashi Kusaka, Satoshi Komatsu, Kunihiro Asada

Institutions: Advantest (Japan), The University of Tokyo, Tokyo Denki University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2328685002

FWCI:

Cites: 15

Cited by:

Related to: 10