Work

Scaling the Dynamic Electron Scattering in Imaging the Graphene Sheets by the High-Angle Annular Dark-Field Microscopy

Year: 2012

Type: article

Source: Journal of Nanoscience and Nanotechnology

DOI: 10.1166/jnn.2012.5445

Authors: W. F. Ding, T. S. Chen, K. M. Liao, L. B. He, F. Q. Song, J. F. Zhou, J. G. Wan, G. H. Wang, M. Han

Institutions: National Laboratory of Solid State Microstructures, Nanjing University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2329527856

FWCI:

Cites:

Cited by: 6

Related to: 10