Work

An Effective Multiple Transition Pattern Generation Method for Signal Integrity Test on Interconnections

Year: 2008

Type: article

Source: Journal of the Institute of Electronics Engineers of Korea

Authors: Yong-Joon Kim, Sungho Kang

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2354471668

FWCI:

Cites:

Cited by:

Related to: 9