Work

New Test Generation Scheme Based on Serial Shifter

Year: 2012

Type: article

Authors: Cai Shuo, Jishun Kuang, Tieqiao Liu

Institution: Hunan University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2363004085

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