Work

Low Power Test Method Based on Scan Chain Two Times Reordering and Combination

Year: 2014

Type: article

Source: Computer Knowledge and Technology

Author: Ge Jiao

Institution: Hengyang Normal University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2371967005

FWCI:

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