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Localizing Test Power Consumption for Scan Testing

Year: 2005

Type: article

Source: 东华大学学报：英文版

Authors: 向东, Li -, Kai-wei

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W201174846

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