Work

Low Peak Power Scan Testing Based on Partitioning Test Operation

Year: 2004

Type: article

Author: Longxing Shi

Institution: Southeast University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2388625680

FWCI:

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Related to: 10