Work

Monitoring of the Growth of Oxide Thin Films Using Reflection High Energy Electron Diffraction System

Year: 2011

Type: article

Source: Journal of Shanxi Datong University

Author: Xie Ting-yue

Institution: Shanxi Datong University

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2391403377

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