Work

Test structures for CMOS RF reliability assessment

Year: 2016

Type: conference-paper

Source: International Conference on Microelectronic Test Structures

DOI: 10.1109/icmts.2016.7476178

Authors: Leonhard Heiss, Andreas Lachmann, Reiner Schwab, Georgos Panagopoulos, Peter Baumgartner, Mamatha Yakkegondi Virupakshappaa, Doris Schmitt-Landsiedel

Institutions: Technical University of Munich, Intel (Germany)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2397225561

FWCI:

Cites: 8

Cited by: 1

Related to: 10