Work

Advances In Wireline Formation Testing

Year: 1995

Type: article

Authors: John Michaels, Mike Moody, Than Shwe

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2470880997

FWCI: 0.647

Cites:

Cited by: 7

Related to: 10