Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study
Year: 2015
Type: erratum
Authors: Alexander G. Shard, Rasmus Havelund, Steve J. Spencer, Ian S. Gilmore, Morgan R. Alexander, Tina B. Angerer, Satoka Aoyagi, Jean-Paul Barnes, Anass Benayad, Andrzej Bernasik, Giacomo Ceccone, Jonathan D. P. Counsell, Christopher Deeks, John S. Fletcher, Daniel J. Graham, Christian Heuser, Tae Geol Lee, Camille Marie, Mateusz M. Marzec, Gautam Mishra, Derk Rading, Olivier Renault, David J. Scurr, Hyun Kyong Shon, Valentina Spampinato, Hua Tian, Fuyi Wang, Nicholas Winograd, Kui Wu, Andreas Wucher, Yufan Zhou, Zihua Zhu, Vanina Cristaudo, Claude Poleunis
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2475163339