Work

Module Level Testing

Year: 1997

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-1-4615-6055-5_14

Author: Earl Crandall

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2497140

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