Circuit reliability simulator-oxide breakdown module
Year: 2003
Type: conference-paper
Authors: E. Rosenbaum, P.M. Lee, R. Moazzami, P.K. Ko, C. Hu
Institution: University of California, Berkeley
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Office of Naval Research
OpenAlex ID: W2545268494