Work

Memristor Based Memories: Defects, Testing, and Testability Techniques

Year: 2017

Type: article

Source: Far East Journal of Electronics and Communications

DOI: 10.17654/ec017010105

Authors: V. Ravi, S. R. S. Prabaharan

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2592948481

FWCI: 1.586

Cites:

Cited by: 10

Related to: 10