Work

Microprocessor Testing: Functional Meets Structural Test

Year: 2017

Type: article

Source: Journal of Circuits Systems and Computers

DOI: 10.1142/s0218126617400072

Authors: A. Touati, A. Bosio, P. Girard, A. Virazel, P. Bernardi, M. Sonza Reorda

Institutions: Centre National de la Recherche Scientifique, Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, Politecnico di Torino

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2593802580

FWCI: 1.462

Cites: 9

Cited by: 7

Related to: 10