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Oprimal Scan Tree Construction with Test Vector Modification for Test Compression

Year: 2003

Type: article

Authors: Kohei Miyase, Seiji Kajihara

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2673080601

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Cites: 19

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Related to: 10