Work

A New Approach to Microns-Resolution Trace Element and Mineralogy Mapping at PPM Sensitivity for Digital Rock and Geological Research

Year: 2017

Type: article

Abstract: Sylvia JY Lewis, SH Lau, Wenbing Yun, Benjamin Stripe, Alan Lyon, David Reynolds, Sharon Chen, Richard Ian Spink; A New Approach to Microns-Resolution Trac

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927617011540

Authors: Sylvia JY Lewis, SH Lau, Wenbing Yun, Benjamin Stripe, Alan Lyon, David Reynolds, Sharon Chen, Richard Ian Spink

Institution: Sigray (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2744998335

FWCI:

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