A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs
Year: 2002
Type: article
DOI: 10.1109/4.982432
Authors: Jae-Kyung Wee, Kyeong-Sik Min, Jong-Tai Park, Sang-Pil Lee, Young-Hee Kim, Tae-Heum Yang, Jong-Doo Joo, Jin-Yong Chung
Institutions: SK Group (United States), Changwon National University
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2788058898