Work

Test Program Generation from High-level Microprocessor Descriptions

Year: 2005

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/1-84628-145-8_6

Authors: E. Sánchez, M. Sonza Reorda, G. Squillero

Institution: Politecnico di Torino

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W28273498

FWCI: 7.83

Cites: 29

Cited by: 11

Related to: 10