Work

Efficient Test Generation Framework for Analog LSI with Behavior Model : (Invited Paper)

Year: 2018

Type: conference-paper

Source: International Conference on Advanced Technologies for Communications

DOI: 10.1109/atc.2018.8587549

Authors: Yuichi Miyazawa, Satoshi Komatsu

Institution: Tokyo Denki University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2908317425

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Cites: 2

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Related to: 10