Work

Automatic Test Pattern Generation Through Boolean Satisfiability for Testing Bridging Faults

Year: 2019

Type: article

Source: Journal of Circuits Systems and Computers

DOI: 10.1142/s0218126619502402

Authors: Hossein Mokhtarnia, Shahram Etemadi Borujeni, Mohammad Saeed Ehsani

Institution: University of Isfahan

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2913446198

FWCI: 0.467

Cites: 37

Cited by: 3

Related to: 10