Work

Mutation Sampling Technique for the Generation of Structural Test Data

Year: 2007

Type: conference-paper

Abstract: Our goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation sampling technique used for generating such data and we present a first evaluation on these validation data with regard to a structural test.

Source: HAL (Le Centre pour la Communication Scientifique Directe)

DOI: 10.48550/arxiv.0710.4802

Authors: Scholive, M., Beroulle, V., Robach, C., Flottes, M. L., Rouzeyre, B.

Institutions: Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, Laboratoire de Conception et d'Intégration des Systèmes, Université de Montpellier

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2953101395

FWCI:

Cites: 2

Cited by:

Related to: 20