Work

Pre-Silicon DFT Verification on SOC Slim Model

Year: 2018

Type: conference-paper

Source: International Workshop on Microprocessor Test and Verification (MTV)

DOI: 10.1109/mtv.2018.00025

Authors: Pratheema Mohandoss, Archana Rengaraj

Institution: Intel (United States)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2953657471

FWCI: 0.365

Cites:

Cited by: 4

Related to: 10