Work

High-Level Functional Test Generation for Microprocessor Modules

Year: 2019

Type: conference-paper

Source: International Conference Mixed Design of Integrated Circuits and Systems

DOI: 10.23919/mixdes.2019.8787131

Authors: Adeboye Stephen Oyeniran, Raimund Ubar

Institution: Tallinn University of Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2965070901

FWCI:

Cites: 24

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Related to: 10