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Year: 2007

Type: article

Authors: Hsieh-Hung Hsieh, Yen‐Chih Huang, Liang-Hung Lu, Guo‐Wei Huang

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2978968785

FWCI:

Cites: 66

Cited by: 2

Related to: 10