Work

Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation

Year: 2019

Type: conference-paper

Source: IEEE International Test Conference (ITC)

DOI: 10.1109/itc44170.2019.9000161

Author: Irith Pomeranz

Institution: Purdue University West Lafayette

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3007941244

FWCI:

Cites: 23

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Related to: 10