Electron spectrometry with SDDs: a GEANT4 based method for detector response reconstruction
Year: 2020
Type: preprint
Abstract: Electron spectrometry is traditionally challenging due to the difficulty of correctly reconstructing the original energy of the detected electrons. Silicon Drift Detectors, extensively used for X-ray spectrometry, are a promising technology for the precise measurement of electrons energy. The ability to correctly model the detector entrance window response to the energy deposited by electrons is a critical aspect of this application. We hereby describe a MonteCarlo-based approach to this problem, together with characterization and validation measurements performed with electron beams from a Scanning Electron Microscope.
Source: arXiv (Cornell University)
Institutions: Istituto Nazionale di Fisica Nucleare, Sezione di Milano Bicocca, Istituto Nazionale di Fisica Nucleare, Sezione di Milano, Politecnico di Milano, University of Milano-Bicocca, Max Planck Society, Halbleiterlabor of the Max-Planck-Society, Max Planck Institute for Physics, Technical University of Munich, Istituto Nazionale di Fisica Nucleare
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W3013395389