Work

Test Methods

Year: 2001

Type: standard

Source: Elsevier eBooks

DOI: 10.1016/b978-075067280-1/50002-8

Author: Stephen F. Scheiber

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3022472910

Cites:

Cited by: 2

Related to: 10