Work

Elemental Mapping by Core Level Excitations in the Analytical Electron Microscope

Year: 1987

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100125877

Author: R.D. Leapman

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3035812808

FWCI:

Cites: 17

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Related to: 10