Work

Application of parallel recorded EELS to analysis of beam-sensitive organic compounds

Year: 1988

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100105229

Author: R.D. Leapman

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3035930385

FWCI:

Cites: 6

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Related to: 10