Work

Detection limits for Analytical Electron Microscopy with Electron Energy Loss Spectrometry and energy-dispersive x-ray spectrometry

Year: 1993

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100148800

Authors: Dale E. Newbury, Richard D. Leapman

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3036805698

FWCI:

Cites: 1

Cited by: 1

Related to: 10