A simulation-based few samples learning method for surface defect segmentation
Year: 2020
Type: article
Source: Neurocomputing
Authors: Taoran Wei, Danhua Cao, Caiyun Zheng, Qun Yang
Institution: Huazhong University of Science and Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3040458218