Work

Determination of the Feature Resolution of Processed Image Data via Statistical Analysis

Year: 2021

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927621000143

Authors: Joseph S. Indeck, Jesus O. Mares, James P. Vitarelli, Kavan Hazeli

Institutions: University of Alabama in Huntsville, Eglin Air Force Base, U.S. Air Force Research Laboratory Munitions Directorate, University of Dayton Research Institute

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3134369019

FWCI: 0.088

Cites: 18

Cited by: 2

Related to: 10