Work

BDD based synthesis of symmetric functions with full path-delay fault testability

Year: 2003

Type: conference-paper

Source: International Conference on Properties and Applications of Dielectric Materials (ICPADM)

DOI: 10.1109/ats.2003.1250825

Authors: Shi, Fey, Drechsler

Institution: University of Bremen

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1997906510

FWCI: 0.23

Cites: 16

Cited by: 9

Related to: 10