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Special Session - Test for AI Chips: from DFT to On-line Testing

Year: 2021

Type: conference-abstract

Source: IEEE VLSI Test Symposium (VTS)

DOI: 10.1109/vts50974.2021.9441057

Authors: Huawei Li, Xiaowei Li, Yu Huang, Ying Wang, Gary Guo

Institutions: Chinese Academy of Sciences, Institute of Computing Technology, Enflame (China)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3170943383

Cites:

Cited by: 3

Related to: 10