Work

New Bist Methodology for Rtl Data Paths Based on Test Compatibility Classes

Year: 2016

Type: article

Source: COMPUSOFT: An International Journal of Advanced Computer Technology

Authors: Prof.Dr.G.Manoj Someswar, B. Babu Rajesh

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3173545248

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